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Technical data


Atomic Force Microscope - educational type

Article no: P2262700

Function and Applications

This teaching system allows students to handle and adjust the setup while performing experiments to image one of the includes samples. This system can achieve sufficient resolution to demonstrate the physical properties and technolgies used in AFMs.

  • Build an Atomic Force Microscope
  • Learn about the Fundamental Forces between Atoms at the probe tip and sample surface
  • Learn about nanometer-precision motion control and hysteresis with piezo-driven actuators
  • Understand the principles behind various scanning methods such as constant height and constant force mode

Equipment and technical details

  • Designed for education, demonstration and classroom use
  • Complete photonics experiment includes all hardware incl. breadboard
  • Incl. extensive manual and teaching materials
  • Easy to assemble and use

 

Scope of delivery

Experiment Set Atomic Force Microscope 08677-00 1
Optical breadboard, optimized Damping 08751-00 1

PHYWE Systeme GmbH & Co. KG
Robert-Bosch-Breite 10 – 37079 Göttingen – Germany
www.phywe.com