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Technical data


Diffraction intensity at a slit and at a wire - Babinet's theorem

Article no: P2230601

Principle

An aperture consisting of a single slit and a complementary strip (wire) is illuminated with a laser beam. The corresponding diffraction patterns are measured according to position and intensity with a photocell which can be shifted.

Benefits

  • surprisingly a slit and a wire show basically the same diffraction pattern
  • measurements prove a theorem that sounds awkward at first glance
  • sturdy setup allows good reproducability of results

Tasks

  1. Determination of the intensity distribution of the diffraction patterns due to a slit and complementary strip (wire).
  2. Determination of the intensity relations of the diffraction pattern peaks for the single slit.
  3. Babinet's theorem is discussed using the diffraction patterns of the slit and the complementary strip.

Learning objectives

  • Huygens' principle
  • Interference
  • Fraunhofer und Fresnel diffraction
  • Babinet's theorem
  • Poissons' spot
  • Coherence
  • Laser

Scope of delivery

Diode pumped solid state laser, green, 1 mW, 532 nm 08765-99 1
Digital array camera 35612-99 1
Optical bench expert, l = 1500 mm 08281-00 1
Base for optical bench expert, adjustable 08284-00 2
Slide mount for optical bench expert, h = 30 mm 08286-01 3
Universal Holder, rotational 08040-02 1
Screen, with diffracting elements 08577-02 1

PHYWE Systeme GmbH & Co. KG
Robert-Bosch-Breite 10 – 37079 Göttingen – Germany
www.phywe.com