Principle
Various metal samples are subjected to polychromatic X-rays. The resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi-channel analyser. The maxima of intensity of the corresponding characteristic X-ray lines are determined. The predefined energy values of the characteristic lines and channels of the multichannel analyser that must be assigned in turn result in a calibration of the semiconductor energy detector.
Tasks
- Record the spectra of the fluorescence radiation that is generated by the metal samples.
- Determine the channel numbers of the maxima intensity of the characteristic lines of the corresponding fluorescence radiation.
- Represent the predefined line energies as a function of the channel numbers graphically for two gain factors of the multichannel analyser.
Learning objectives
- Bremsstrahlung
- Characteristic X-radiation
- Energy levels
- Fluorescence radiation
- Conduction processes in semiconductors
- Doping of semiconductors
- Pin-diodes
- Semiconductor energy detectors
- Multichannel analysers