Function and Applications
Easy to use scanning tunneling microscope to image conducting surfaces and to investigate effects and characteristics on atomic and molecular scale. A variety of experiments in the fields of Material Sciences, Solid State Physics/Chemistry, Nanotechnology and Quantum Mechanics can be performed.
Equipment and Technical Data
- Scan head with integrated control-unit on vibration-isolated experimentation board:
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- Maximum scan range (XY) 500 nm x 500 nm
- Maximum Z-range 200 nm
- Resolution in XY better than 8 pm
- Resolution in Z better than 4 pm
- Current 0.1-100 nA in 25 pA steps
- Tip voltage +/-10 V in 5 mV steps
- Dimensions 21 cm x 21 cm x 10 cm
- Constant-Current Mode
- Constant-Height Mode
- Current-Voltage Spectroscopy
- Current-Distant Spectroscopy
- Control-Unit with USB socket, 16-Bit
- DA converter for all three dimensions, up to 7 measurement channels, and maximum scanning speed of 60 ms/line
- Imaging speed: up to 10 Hz
- Lithography mode: patterning, modification
- Sample size: max. 3 mm thickness
- Data points in spectroscopy mode: up to 65535
- Scan head cover with magnifying lense: 10 x
- Toolset for preparing and mounting tunneling tips: side-cutter, tong and tweezers
- Pt-Ir wire for tunneling tips: length 30 cm, diameter 0.25 mm
- Sample kit: Graphite (HOPG), Gold (111) films, and 4 spare sample supports
- Power supply (100-240 V, 50/60 Hz), USB cable
- Transport case for the instrument and all accessories
- Software for measuring, analysing and visualisation (one, two, and three dimensions)
- Interactive teaching software
- Handbook incl. short description of experiments
- Weight (incl. case) 6.7 kg
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