Function and Applications
Cantilever electrical measurement modes of the atomic force microscope (09700-99)
Equipment and Technical Data
- for electrical modes (EFM, Spreading resistance, Force modulation)
- Material: Si, monolithic
- Coating on both sides: electrical conductive (Pt/Cr)
- Holder chip: 3.4 x 1.6 x 0.3 mm, with alignment grooves
- Tip radius: less than 25nm
- Resonance Frequency: 75 kHz
- Spring constant: 3 N/m
- Length: 0.225mm
- Width: 0.028mm
- 10 pcs
- Weight: 0.04 kg
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